focussed ion beam scanning electron microscopy (FIB-SEM)
http://purl.obolibrary.org/obo/FBbi_00050000
A method of reconstructing 3D structure by combining focussed ion beam milling to remove sucessive layers from a sample block with scanning EM to image the exposed surface between each milling step. [ PMID:22119321 ]
Term info
A method of reconstructing 3D structure by combining focussed ion beam milling to remove sucessive layers from a sample block with scanning EM to image the exposed surface between each milling step.
FIB-SEM
image
FBbi:00050000